Interface migration and control of microstructure: international symposium : ASM's metal congress : TMS/AIME fall meeting : Detroit, MI, 17.09.84-21.09.84.

Interface migration and control of microstructure :

Saved in:
Pande, C. S., (editor)
Metals-Park, OH : American Society for Metals, 1986.
VIII, 204 S.
englisch
0871702606
9780871702609

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