Properties of strained and relaxed silicon germanium.
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Personal Name(s): | Kasper, E., editor |
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Imprint: |
London :
Institution of Electrical Engineers,
1995.
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Physical Description: |
XIV, 232 S. |
Note: |
englisch |
ISBN: |
0852968264 9780852968260 |
Series Title: |
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EMIS datareviews series ;
12. |
Keywords: |
strained layer systems strained and relaxed SiGe alloys |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
ZB | |
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Reading Room Call number: SHE 015-12 Barcode: 1096104288 Reference Collection |