Scanning Electron Microscopy [E-Book] : Physics of Image Formation and Microanalysis / by Ludwig Reimer.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling...
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Full text |
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Personal Name(s): | Reimer, Ludwig, author |
Edition: |
Second Completely Revised and Updated Edition. |
Imprint: |
Berlin, Heidelberg :
Springer,
1998
|
Physical Description: |
XIV, 529 p. online resource. |
Note: |
englisch |
ISBN: |
9783540389675 |
DOI: |
10.1007/978-3-540-38967-5 |
Series Title: |
/* Depending on the record driver, $field may either be an array with
"name" and "number" keys or a flat string containing only the series
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Springer Series in Optical Sciences ;
45 |
Subject (LOC): |
LEADER | 02272nam a22004215i 4500 | ||
---|---|---|---|
001 | 978-3-540-38967-5 | ||
003 | Springer | ||
008 | 130806s1998 gw | s |||| 0|eng d | ||
020 | |a 9783540389675 | ||
024 | 7 | |a 10.1007/978-3-540-38967-5 |2 doi | |
035 | |a (Sirsi) a675238 | ||
041 | |a eng | ||
082 | 0 | 4 | |a 621.36 |2 23 |
100 | 1 | |a Reimer, Ludwig, |e author | |
245 | 1 | 0 | |a Scanning Electron Microscopy |h [E-Book] : |b Physics of Image Formation and Microanalysis / |c by Ludwig Reimer. |
250 | |a Second Completely Revised and Updated Edition. | ||
264 | 1 | |a Berlin, Heidelberg : |b Springer, |c 1998 |e (Springer LINK) |f SpringerPhysicsAstronomyArchiv | |
300 | |a XIV, 529 p. |b online resource. | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a computer |b c |2 rdamedia | ||
338 | |a online resource |b cr |2 rdacarrier | ||
347 | |a text file |b PDF |2 rda | ||
490 | |a Springer Series in Optical Sciences ; |v 45 | ||
500 | |a englisch | ||
505 | 0 | |a Electron Optics of a Scanning Electron Microscope -- Electron Scattering and Diffusion -- Emission of Backscattered and Secondary Electrons -- Electron Detectors and Spectrometers -- Image Contrast and Signal Processing -- Electron-Beam-Induced Current and Cathodoluminescence -- Special Techniques in SEM -- Crystal Structure Analysis by Diffraction -- Elemental Analysis and Imaging with X-Rays. | |
520 | |a Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. | ||
650 | 0 | |a Interfaces (Physical sciences). | |
650 | 0 | |a Microscopy. | |
650 | 0 | |a Physics. | |
650 | 0 | |a Solid state physics. | |
650 | 0 | |a Spectroscopy. | |
650 | 0 | |a Surfaces (Physics). | |
650 | 0 | |a Thin films. | |
856 | 4 | 0 | |u http://dx.doi.org/10.1007/978-3-540-38967-5 |z Volltext |
915 | |a zzwFZJ3 | ||
932 | |a Physics and Astronomy (Springer-11651) | ||
596 | |a 1 | ||
949 | |a XX(675238.1) |w AUTO |c 1 |i 675238-1001 |l ELECTRONIC |m ZB |r N |s Y |t E-BOOK |u 15/12/2017 |x UNKNOWN |z UNKNOWN |1 ONLINE |