This title appears in the Scientific Report :
2001
Characterization of thin layered structures for magnetoelectronic applications
Characterization of thin layered structures for magnetoelectronic applications
Saved in:
Personal Name(s): | Rücker, U. |
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Kentzinger, E. | |
Contributing Institute: |
Streumethoden; IFF-STM |
Published in: |
ESS-Begutachtung durch den Wissenschaftsrat |
Imprint: |
2001
|
Conference: | Jülich 2001-12-10 |
Document Type: |
Poster |
Research Program: |
Methodenentwicklung für Synchrotron- und Neutronenstrahlung |
Publikationsportal JuSER |
Description not available. |