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Hawkes, Peter W.
FHE - Imaging methods in materials characterization
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Hawkes, Peter W.
FHE - Imaging methods in materials characterization
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1
Book
Advances in imaging and electron physics. 115 /
Hawkes, Peter W.
2001
Subject (ZB):
“
...scanning
electron
microscopy...
”
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2
Book
Advances in imaging and electron physics. 113 /
Hawkes, Peter W.
2000
Subject (ZB):
“
...scanning transmission
electron
microscopy...
”
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3
Book
Advances in imaging and electron physics. 100 /
Hawkes, Peter W.
1998
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...
electron
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4
Book
Advances in imaging and electron physics. 101 /
Hawkes, Peter W.
1998
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...transmission
electron
microscopy...
”
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5
Book
Advances in imaging and electron physics. 99 /
Hawkes, Peter W.
1997
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...
electron
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6
Book
Advances in imaging and electron physics. 97 /
Hawkes, Peter W.
1996
Subject (ZB):
“
...
electron
optics...
”
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7
Book
Advances in imaging and electron physics. 95 /
Hawkes, Peter W.
1996
Subject (ZB):
“
...
electron
emission...
”
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8
Book
Advances in imaging and electron physics. 96. The growth of electron microscopy /
Hawkes, Peter W.
1996
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...
electron
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9
Book
Advances in imaging and electron physics. 93 /
Hawkes, Peter W.
1995
Subject (ZB):
“
...STEM [scanning transmission
electron
microscopy)...
”
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10
Book
Advances in imaging and electron physics. 90 /
Hawkes, Peter W.
1995
Subject (ZB):
“
...
electron
diffraction...
”
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11
Book
Advances in imaging and electron physics. 91 /
Hawkes, Peter W.
1995
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...
electron
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”
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12
Book
Advances in imaging and electron physics. 94 /
Hawkes, Peter W.
1995
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“
...
electron
microscopy...
”
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Available as
Print Edition
12
Material Type
Book
12
Year of Publication
From:
To:
Location
ZB
12
Name
Hawkes, Peter W.
Subject
imaging technique
10
electron microscopy
5
image processing
5
electron microscope
2
electron optics
2
signal processing
2
more ...
Fourier transform
1
III - V semiconductor
1
STEM [scanning transmission electron microscopy)
1
algebra
1
electron diffraction
1
electron emission
1
electron lens
1
electron physics
1
electronic equipment
1
exploitation
1
fluorescence
1
group theory
1
high resolution
1
historical aspect
1
holography
1
image analysis
1
image reconstruction
1
information theory
1
lens
1
numerical calculation
1
optical fiber
1
orientation
1
photoemission
1
radioastronomy
1
see all ...
less ...
Classification
FHE - Imaging methods in materials characterization
FHG - Electron microscopy
2
FAHH - Materials research - historical aspects
1
FAN - Solid state physics - mathematical methods, computer applications
1
FHJ - Scanning electron microscopy, analytical electron microscopy
1
PEDA - Electron radiation, electron optics
1
more ...
TBT - Optoelectronics, optical fibers, displays
1
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Language
English
12
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