1
Mechanical Properties of Polymers Measured through AFM Force-Distance Curves [E-Book] /
2
Transmission Electron Microscopy and Diffractometry of Materials [E-Book] /
3
Applied Scanning Probe Methods V [E-Book] : Scanning Probe Microscopy Techniques /
4
Electronic Structure of Semiconductor Heterojunctions [E-Book] /
5
Helium Ion Microscopy [E-Book] /
6
Sputtering by Particle Bombardment III [E-Book] : Characteristics of Sputtered Particles, Technical Applications /
7
Computer Simulation of Ion-Solid Interactions [E-Book] /
8
Thin Film and Depth Profile Analysis [E-Book] /
9
Transmission Electron Microscopy and Diffractometry of Materials [E-Book] /
10
Advances in Solid State Physics [E-Book] /
11
Particle Induced Electron Emission II [E-Book] /
12
Particle Induced Electron Emission I [E-Book] /
13
X-Ray Scattering from Soft-Matter Thin Films [E-Book] : Materials Science and Basic Research /
14
Ellipsometry for Industrial Applications [E-Book] /
15
Theoretical Surface Science [E-Book] : A Microscopic Perspective /
16
The Frenkel-Kontorova Model [E-Book] : Concepts, Methods, and Applications /
17
High-Temperature-Superconductor Thin Films at Microwave Frequencies [E-Book] /
18
Microbeam and Nanobeam Analysis [E-Book] /
19
Surface Diffusion [E-Book] : Atomistic and Collective Processes /
20
Advances in Solid State Physics [E-Book] /