Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Electronic Edition
English
4 filters
Engineering.
AND
Nanotechnology.
AND
force microscopy
AND
scanning probe microscopy
Reset Filters
Show filters (6)
Electronic Edition
English
4 filters
Engineering.
AND
Nanotechnology.
AND
force microscopy
AND
scanning probe microscopy
Ask a Librarian
Books & more
: Hits
1 - 5
of
5
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
E-Book
CMOS Cantilever Sensor Systems [E-Book] : Atomic Force Microscopy and Gas Sensing Applications /
Lange, D.
2002
Full text
Favorites
Saved in:
QR Code
Select result number 2
2
E-Book
Scanning Probe Microscopy [E-Book] : Atomic Force Microscopy and Scanning Tunneling Microscopy /
Voigtländer, Bert.
2015
Full text
Favorites
Saved in:
QR Code
Select result number 3
3
E-Book
Atomic Force Microscopy [E-Book] /
Voigtländer, Bert
2019
Full text
Favorites
Saved in:
QR Code
Select result number 4
4
E-Book
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching [E-Book] : Application to Rough and Natural Surfaces /
Kaupp, Gerd.
2006
Full text
Favorites
Saved in:
QR Code
Select result number 5
5
E-Book
Noncontact Atomic Force Microscopy [E-Book] : Volume 2 /
Giessibl, Franz J.
2009
Full text
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Electronic Edition
Material Type
Book
5
Type of Literature
Handbook, Textbook
1
Year of Publication
From:
To:
Location
ZB
5
Name
Baltes, H.
1
Brand, O.
1
Giessibl, Franz J.
1
Kaupp, Gerd.
1
Lange, D.
1
Morita, Seizo.
1
more ...
Voigtländer, Bert
1
Voigtländer, Bert.
1
Wiesendanger, Roland.
1
see all ...
less ...
Subject
Engineering.
Nanotechnology.
force microscopy
scanning probe microscopy
Microscopy.
2
Condensed matter.
1
more ...
Control engineering.
1
Materials science.
1
Measurement.
1
Mechanics, Applied.
1
Mechanics.
1
Mechatronics.
1
Optics.
1
Optoelectronics.
1
Physical chemistry.
1
Physical measurements.
1
Physics.
1
Plasmons (Physics).
1
Robotics.
1
Science.
1
Spectroscopy.
1
see all ...
less ...
Language
English
×
Loading...