1
Introduction to surface and thin film processes /
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Introduction to surface roughness and scattering /
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Light scattering by liquid surfaces and complementary techniques /
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Introduction to surface roughness and scattering /
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Applied surface analysis : Applied surface analysis: symposium. 0004 : Dayton, OH, 09.06.82-11.06.82.
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Practical surface analysis : by Auger and x-ray photoelectron spectroscopy /
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Briggs, D.
1983
“...FHAB - Surface and thin film characterization...”
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Oberflächenanalytik in der Metallkunde : Methoden und Anwendungen: Fortbildungsseminar: Lehrinhalt und Vortragstexte : Düsseldorf, 07.83.
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Electron and ion beam methods for surface analysis : international workshop : Newcastle, 23.02.81-27.02.81.
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Applied surface analysis : symposium. 2 : Papers : Dayton, OH, 11.06.80-13.06.80.
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Applied surface analysis : symposium. 0003 : Dayton, OH, 03.06.81-05.06.81.
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Non traditional approaches to the study of the solid electrolyte interface : Proceedings of an international conference : Snowmass, CO, 24.09.79-27.09.79.
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Applied surface analysis : symposium. 1 : Dayton, OH, 11.06.79-13.06.79.
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Applications of advanced surface spectroscopic techniques : Solid vacuum interface conference 6 : Delft, 07.05.80-09.05.80.
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1980
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Handbuch Festkörperanalyse mit Elektronen, Ionen und Röntgenstrahlen /
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