X-Ray Microscopy and Spectromicroscopy [E-Book] : Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996 /  

Rudolph, Dietbert
1998

Semiconductor Interfaces [E-Book] : Formation and Properties /  

Boccara, Nino
1987

High-Resolution X-Ray Scattering from Thin Films and Multilayers [E-Book] /  

Holý, Václav
1999