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IEK-14
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1
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Practical surface analysis . 2 . Ion and neutral spectroscopy /
Briggs, D.
1992
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...Practical surface
analysis
;...
”
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2
Book
Practical surface analysis . 1 . Auger and x-ray photoelectron spectroscopy
Briggs, D.
1990
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...Practical surface
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3
Book
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
Benninghoven, Alfred
1987
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...Chemical
analysis
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3
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Book
3
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Location
IEK-14
ZB
3
IBN-1-2
2
IEK-4
2
IBN-3-4
1
Name
Briggs, D.
2
Benninghoven, Alfred
1
Rüdenauer, Friedrich G.
1
Werner, H. W.
1
Subject
surface analysis
2
Auger electron spectroscopy
1
SIMS (secondary ion mass spectroscopy)
1
ion beam analysis
1
photoelectron spectroscopy
1
Classification
FGGJ - Ion beam analysis, ion beam solid interaction
2
FHAB - Surface and thin film characterization
2
FFGC - Electron spectroscopy
1
Language
English
1
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