41
PDMs and clusters. 1 : International Workshop on the Physics of Small Systems : proceedings : Wangerooge, 08.09.1986-12.09.1986 /
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42
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
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43
Symposium on ion beam technology Hosei University 0004: proceedings : Tokyo, 06.12.85-07.12.85.
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Sebe, T.
1986
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44
Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie : 20 Tabellen /
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Microbeam analysis. 1986 : Proceedings : Annual conference of the Microbeam Analysis Society 0021 : Albuquerque, NM, 11.08.1986-15.08.1986.
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46
Secondary ion mass spectrometry: international conference 0005: proceedings : SIMS 0005: proceedings : Washington, DC, 30.09.1985-04.10.1985.
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Collisions of fast charged particles in solids /
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48
Desorption induced by electronic transitions 2 : DIET II ;proceedings of the international workshop, Schloss-Elmau, Bavaria, 15.10.84-17.10.84
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Brenig, W.
1985
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49
Ion beam analysis : Symposium on ion beam technology Hosei University 0003: proceedings : Tokyo, 07.12.84-08.12.84.
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Sebe, T.
1985
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50
Desorption mass spectrometry : Are sims and fab the same: developed from a symposium : Saint-Paul, MN, 07.10.1984-10.10.1984.
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51
The stopping and range of ions in solids.
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52
Medium energy ion reflection from solids.
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Microbeam analysis. 1985 : Proceedings : Annual conference of the Microbeam Analysis Society. 20 : Louisville, KY, 05.08.1985-09.08.1985 /
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54
Fluoreszenzspektroskopische Bestimmung der Flußdichte von zerstäubtem Titan bei reinen und oxidierten Oberflächen [E-Book] /
Dullni, E.
1984
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Microbeam analysis. 1984 : Annual conference of the Microbeam Analysis Society 0019 : Bethlehem, PA, 16.07.1984-20.07.1984.
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Elektronenstimulierte Desorption an Stickoxiden auf Pt(100) Flächen [E-Book] /
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57
Thin film and depth profile analysis.
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Secondary ion mass spectrometry: international conference 0004: proceedings : SIMS 0004: proceedings : Osaka, 13.11.1983-19.11.1983.
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Microbeam analysis. 1983 : Proceedings : Annual conference of the Microbeam Analysis Society 0018 : Phoenix, AZ, 06.08.1983-12.08.1983.
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Gooley, R.
1983
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60
Charged beam interaction with solids.
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