1
Epitaktische Seltenerd-Scandatschichten für die Mikroelektronik /
Book
...FGMH - Metallization, physics of microelectronics...
Table of Contents 
2
Gettering and defect engineering in semiconductor technology : GADEST 2003 : proceedings of the 10th international autumn meeting Seehotel Zeuthen (suburb of Berlin) State of Brandenburg, Germany, Septemer 21-26, 2003 /
Book
3
Elektrische und optoelektrische monolithisch integrierte Schaltungen auf InP-basierenden Heterostrukturen [E-Book] /
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The physics of information technology /
Book
...FGMH - Metallization, physics of microelectronics...
5
Silicides : fundamentals and applications : proceedings of the 16th course of the international school of solid state physics, Erice, Italy 5 - 6. June 1999 /
Book
...FGMH - Metallization, physics of microelectronics...
6
Quantum heterostructures : microelectronics and optoelectronics /
Book
...FGMH - Metallization, physics of microelectronics...
7
Stress induced phenomena in metallization : 5th International Workshop [on Stress Induced Phenomena in Metallization] : Stuttgart, Germany, June 1999 /
Book
...FGMH - Metallization, physics of microelectronics...
8
Materials reliability in microelectronics. 8 : symposium held April 13-16, 1998, San Francisco, California, USA /
Book
...FGMH - Metallization, physics of microelectronics...
9
Mechanische Spannungen und Elektromigration in passivierten Leiterbahnen [E-Book] /
10
Einfluß von Passivierung und von Legierungszusätzen auf die thermischen Spannungen von Leiterbahnen in integrierten Schaltkreisen [E-Book] /
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Elastisches und plastisches Verhalten passivierter Leiterbahnen in integrierten Schaltkreisen: FEM-Rechnungen und röntgenographische Spannungsmessungen [E-Book] /
12
Gate dielectrics and MOS ULSls : principles, technologies and applications /
Book
...FGMH - Metallization, physics of microelectronics...
13
In-situ TEM-Untersuchungen des durch thermische Spannungen und Elektromigration induzierten Materietransports in Al-Leiterbahnen [E-Book] /
14
Materials reliability in microelectronics. 6 : symposium held April 8-12.1996, San Francisco, California, USA /
Book
...FGMH - Metallization, physics of microelectronics...
15
Advanced metallization for future ULSI : symposium held April 8-11, 1996, San Francisco, California, USA : [Symposium on Advanced Metallization for Future ULSI] /
Book
Tu, K. N.
1997
...FGMH - Metallization, physics of microelectronics...
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Materials reliability in microelectronics. 7 : symposium held March 31-April 3, 1997, San Francisco, California, USA /
Book
...FGMH - Metallization, physics of microelectronics...
17
Transport simulation in microelectronics /
Book
...FGMH - Metallization, physics of microelectronics...
18
Materials reliability in microelectronics. 5 : symposium San-Francisco, CA, 17.04.95-21.04.95.
Book
...FGMH - Metallization, physics of microelectronics...
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Electronic packaging materials science 0007: symposium : MRS fall meeting 1993 : Boston, MA, 29.11.93-01.12.93.
Book
...FGMH - Metallization, physics of microelectronics...
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Electromigration and electronic device degradation /
Book
...FGMH - Metallization, physics of microelectronics...