1
Working smarter with surface analysis techniques.
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1999
“...FHAB - Surface and thin film characterization...”
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Sekundärionenmassenspektrometrie und Neutralteilchenmassenspektrometrie an oxidischen Dünnschichtsystemen: der Einfluss ionenbeschussindizierter Prozesse auf die Sekundärteilchenemission im Zerstäubungsgleichgewicht und an Schichtgrenzflächen.
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Subject (ZB): “...thin film...”
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3
Encyclopedia of materials characterization : surfaces, interfaces, thin films /
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Practical surface analysis . 2 . Ion and neutral spectroscopy /
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Briggs, D.
1992
“...FHAB - Surface and thin film characterization...”
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5
Analysis of microelectronic materials and devices.
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“...FHAB - Surface and thin film characterization...”
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6
Practical surface analysis . 1 . Auger and x-ray photoelectron spectroscopy
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Briggs, D.
1990
“...FHAB - Surface and thin film characterization...”
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7
Thin film and depth profile analysis.
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“...FHAB - Surface and thin film characterization...”
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