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FGGJ - Ion beam analysis, ion beam solid interaction
ion beam analysis
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FGGJ - Ion beam analysis, ion beam solid interaction
ion beam analysis
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1
Book
Electron and ion beam methods for surface analysis : international workshop : Newcastle, 23.02.81-27.02.81.
Grant, J. T.
1982
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2
Book
Handbook of modern ion beam materials analysis /
Tesmer, Joseph R.
1995
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3
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Handbook of modern ion beam materials analysis /
Wang, Yongqiang
2009
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4
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Handbook of modern ion beam materials analysis : appendices /
Wang, Yongqiang
2009
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5
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High energy and heavy ion beams in materials analysis: workshop: proceedings : Albuquerque, NM, 14.06.89-16.06.89.
Tesmer, Joseph R.
1990
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6
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Ion beam analysis : Symposium on ion beam technology Hosei University 0003: proceedings : Tokyo, 07.12.84-08.12.84.
Sebe, T.
1985
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7
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Ion implantation, laser treatment and ion beam analysis of materials : proceedings of the international workshop : Bombay, 09.02.81-13.02.81.
Sood, D. K.
1982
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8
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Ion spectroscopies for surface analysis /
Czanderna, Alvin Warren
1991
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9
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Practical surface analysis . 2 . Ion and neutral spectroscopy /
Briggs, D.
1992
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10
Book
Sonde zur Messung der Intensitätsverteilung in einem Ionenstrahl /
Kurz, U.
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11
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Symposium on ion beam technology Hosei University 0004: proceedings : Tokyo, 06.12.85-07.12.85.
Sebe, T.
1986
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12
E-Book
Untersuchung von Interdiffusion, elastischer Gitterverzerrung und Relaxation in epitaktischen Si(1-x)Ge(x)/Silicon Heterostrukturen mit Ionenstreuung [E-Book] /
Holländer, Bernhard
1991
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/* Narrow Search Options */ ?>
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Available as
Print Edition
11
Electronic Edition
1
Material Type
Book
12
Type of Literature
Conference Publication
5
Handbook, Textbook
3
Theses
1
Year of Publication
From:
To:
Location
ZB
10
IEK-4
3
IEK-2
2
IFF
2
IBN-3-4
1
IEK-14
1
Name
Sebe, T.
2
Tesmer, Joseph R.
2
Wang, Yongqiang
2
Barbour, J. Charles
1
Briggs, D.
1
Czanderna, Alvin Warren
1
more ...
Grant, J. T.
1
Holländer, Bernhard
1
Kurz, U.
1
Lipperts, H.
1
Maggiore, Carl J.
1
Mayer, James W.
1
Nastasi, Michael
1
Reimer, W.
1
Sood, D. K.
1
see all ...
less ...
Subject
ion beam analysis
backscattering
4
accelerator
3
activation analysis
3
channeling
3
charged particle
3
more ...
energy loss
3
instrumentation
3
radiology
3
thin film
3
ion beam technology
2
electron spectroscopy
1
elemental semiconductor
1
heavy ion
1
heterostructure
1
intensity
1
surface analysis
1
see all ...
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Classification
FGGJ - Ion beam analysis, ion beam solid interaction
FGG - Ion beam technology
2
FHAB - Surface and thin film characterization
2
FFGC - Electron spectroscopy
1
FFPG - Multilayer systems, quantum structures
1
FGGB - Ion implantation, ion beam synthesis
1
more ...
FGJ - Laser and electron beam processing
1
FJKB - Elemental semiconductors
1
see all ...
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Language
English
1
German
1
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