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FGGJ - Ion beam analysis, ion beam solid interaction

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FGGJ - Ion beam analysis, ion beam solid interaction

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Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie : 20 Tabellen /

Grasserbauer, Manfred.
1986

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Annual conference of the Microbeam Analysis Society 0009: tutorial and proceedings : Ottawa, 22.07.74-26.07.74.

1974

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Annual conference of the Microbeam Analysis Society 0013: proceedings : Ann-Arbor, MI, 19.06.78-23.06.78.

1978

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Applied atomic collision physics. 4. Condensed matter.

Datz, S.
1983

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Atomic and ion collisions in solids and at surfaces: theory, simulation and applications.

Smith, R.
1997

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Atomic and ionic impact phenomena on metal surfaces /

Kaminsky, Manfred
1965

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Atomic collision phenomena in solids : proceedings of an International Conference held at the University of Sussex, Brighton, England, from 7th to 12th Sept., 1969 /

Palmer, D. W.
1970

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Atomic collisions in crystals /

Kumakhov, M. A.
1989

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Atomic collisions in solids : International conference on atomic collisions in solids 0006 : Amsterdam, 22.09.75-26.09.75

Saris, F. W.
1976

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Atomic collisions in solids. 4. physics of channeling and related phenomena: International conference on atomic collisions in solids . 4: physics of channeling and related phenomen...

Andersen, Sven Lilledal
1972

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Atomic collisions in solids vol 0001 : International conference on atomic collisions in solids 0005 vol 01 : Gatlinburg, TN, 24.09.73-28.09.73.

Datz, S.
1975

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Atomic collisions in solids vol 0002 : International conference on atomic collisions in solids 0005 vol 02 : Gatlinburg, TN, 24.09.73-28.09.73.

Datz, S.
1975

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Atomic displacement rates of light ions in cubic metals [E-Book] /

Jung, Peter
1983

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Atomnye stolknoveniya v tverdykh telakh vol 0001 : Mezhdunarodnaya konferentsiya atomnye stolknoveniya v tverdykh telakh 0007: trudy vol 01 : International conference on atomic col...

Bulgakov, Yu. V.
1981

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Atomnye stolknoveniya v tverdykh telakh vol 0002 : Mezhdunarodnaya konferentsiya atomnye stolknoveniya v tverdykh telakh 0007: trudy vol 02 : International conference on atomic col...

Bulgakov, Yu. V.
1981

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Ausgezeichnete Stossfolgen in Metallen: ihre experimentelle Untersuchung mit Hilfe der Kathodenzerstaeubung /

Kopitzki, K.
1966

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Auswirkungen des Abbremsvorganges von Ionen in dünnen Schichten untersucht mittels KARMA am Beispiel der Hochdosisionenimplantation, der Dosisabhängigkeit der Zerstäubungsausbeute...

Etzkorn, H. W.
1980

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Autor title index.

Gibson, W. M.
1980

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Backscattering spectrometry /

Chu, Wei-Kan
1978

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Beam solid interactions: fundamentals and applications: symposium : MRS fall meeting 1992 : Boston, MA, 30.11.92-04.12.92.

Nastasi, M.
1993

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Print Edition 124 Electronic Edition 17

Book 142

Conference Publication 58 Theses 13 Collection of Tables 13 Report 8 Handbook, Textbook 6

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ZB 137 IEK-4 11 IEK-14 10 IKP 10 IBN-1-2 7 IBN-3-4 6 more ... IFF 4 IEK-2 2 see all ... less ...

Benninghoven, A. 8 Mayer, James W. 5 Ziegler, J. F. 4 Datz, S. 3 Gibson, W. M. 3 Kumakhov, M. A. 3 more ... Andersen, Hans Henrik 2 Archard, Geoffry D. 2 Arifov, Ubal Arifovich 2 Briggs, D. 2 Brümmer, Otto 2 Bulgakov, Yu. V. 2 Etzkorn, H. W. 2 Gibbons, J. F. 2 Johnson, W. S. 2 Komarov, F. F. 2 Littmark, U. 2 Mylroie, S. W. 2 Nastasi, M. 2 Romig, A. D. 2 Sebe, T. 2 Sigmund, P. 2 Tesmer, Joseph R. 2 Tolk, N. H. 2 Vickerman, John C. 2 Wang, Yongqiang 2 Ziegler, James F. 2 Andersen, Christian A. 1 Andersen, Sven Lilledal 1 Armstrong, John T. 1 see all ... less ...

ion beam solid interaction 15 channeling 14 ion beam analysis 12 SIMS (secondary ion mass spectroscopy) 11 desorption 8 atomic collision 7 more ... electron microprobe analysis 7 sputtering 7 ion scattering 6 backscattering 5 ion channeling 5 ion surface collision 5 radiation damage 5 ion irradiation 4 stopping power 4 surface analysis 4 Auger electron spectroscopy 3 accelerator 3 activation analysis 3 charged particle 3 energy loss 3 instrumentation 3 ion implantation 3 ion microprobe analysis 3 ion source 3 radiology 3 thin film 3 computer simulation 2 cross section 2 electron spectroscopy 2 see all ... less ...

FGGJ - Ion beam analysis, ion beam solid interaction FAAB - Solid state physics - reference books 16 FHJC - Microbeam analysis 16 FGGB - Ion implantation, ion beam synthesis 14 FGG - Ion beam technology 9 FHAB - Surface and thin film characterization 8 more ... CUW - Mass spectroscopy 3 FFGC - Electron spectroscopy 3 FFGH - Electron emission, field emission 3 FFJ - Surface structure, gas solid interface 3 CUH - Luminescence, fluorescence analysis 2 FANE - Computational solid state physics 2 FDF - Radiation effects in solids 2 FGGE - Ion beam surface modification 2 FGJ - Laser and electron beam processing 2 CBRH - Inorganic clusters 1 CTYR - Microanalysis 1 FAF - Materials research - comprehensive works 1 FDFC - Radiation effects in metals, nuclear radiation effects 1 FFPG - Multilayer systems, quantum structures 1 FHA - Materials characterization - general aspects 1 FHEE - X-ray microscopy, surface topography 1 FHEG - Tunneling microscopy, force microscopy 1 FHGE - Electron diffraction 1 FJCK - Electrical conduction in solid materials 1 FJKB - Elemental semiconductors 1 FLE - Superconductor materials 1 PGLJ - Plasma wall interaction, divertors 1 see all ... less ...

English 26 German 10 Multilingual 1

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