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FGGJ - Ion beam analysis, ion beam solid interaction

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FGGJ - Ion beam analysis, ion beam solid interaction

English

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Atomic and ionic impact phenomena on metal surfaces /

Kaminsky, Manfred
1965

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Atomic collisions in solids : International conference on atomic collisions in solids 0006 : Amsterdam, 22.09.75-26.09.75

Saris, F. W.
1976

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Atomic collisions in solids. 4. physics of channeling and related phenomena: International conference on atomic collisions in solids . 4: physics of channeling and related phenomen...

Andersen, Sven Lilledal
1972

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Backscattering spectrometry /

Chu, Wei-Kan
1978

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Bibliography and index of experimental range and stopping power data /

Andersen, Hans Henrik
1977

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Electron and ion spectroscopy of solids : Based on the lectures pres. at the NATO Advanced Study Institute : Gent, 29.08.77-09.09.77 /

Fiermans, L.
1978

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Handbook of range distributions for energetic ions in all elements /

Littmark, U.
1980

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Hydrogen: stopping powers and ranges in all elements /

Andersen, Hans Henrik
1977

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Interaction of atomic particles with a solid surface /

Arifov, Ubal Arifovich
1969

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Ion spectroscopies for surface analysis /

Czanderna, Alvin Warren
1991

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Low energy ion beams. 1977 : invited and contributed papers from the international conference : Salford, 05.09.77-08.09.77 /

Stephens, K. G.
1978

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Material characterization using ion beams : NATO Advanced Study Institute on Material Characterization Using Ion Beams : Aleria, 29.08.76-12.09.76 /

Thomas, J. P.
1978

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Microbeam analysis. 1985 : Proceedings : Annual conference of the Microbeam Analysis Society. 20 : Louisville, KY, 05.08.1985-09.08.1985 /

Armstrong, John T.
1985

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Microprobe analysis /

Andersen, Christian A.
1973

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Radiation effects on solid surfaces : American Chemical Society: meeting. 0170 : Chicago, IL, 25.08.75-26.08.75 /

Kaminsky, M.
1976

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Secondary emission and structural properties of solids /

Arifov, Ubal Arifovich
1971

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Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /

Benninghoven, Alfred
1987

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Secondary ion mass spectrometry : Secondary ion mass spectrometry and ion microprobe mass analysis: proceedings of a workshop : Gaithersburg, MD, 16.09.1974-18.09.1974 /

Heinrich, K. F.
1975

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SRIM : the stopping and range of ions in matter /

Ziegler, James F.
2008

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Studies in penetration of charged particles in matter

1964

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Book 21

Conference Publication 9 Collection of Tables 3

From:

To:

ZB 21 IEK-4 5 IKP 4 IBN-1-2 2 IEK-14 1

Andersen, Hans Henrik 2 Archard, Geoffry D. 2 Arifov, Ubal Arifovich 2 Ziegler, James F. 2 Andersen, Christian A. 1 Andersen, Sven Lilledal 1 more ... Armstrong, John T. 1 Benninghoven, Alfred 1 Biersack, Jochen P. 1 Björkqvist, K. 1 Burstein, Elias 1 Chu, Wei-Kan 1 Czanderna, Alvin Warren 1 Fiermans, L. 1 Heinrich, K. F. 1 Johansson, N. G. E. 1 Kaminsky, M. 1 Kaminsky, Manfred 1 Littmark, U. 1 Mayer, James W. 1 Nicolet, Marc-A. 1 Rüdenauer, Friedrich G. 1 Saris, F. W. 1 Stephens, K. G. 1 Thomas, J. P. 1 Werner, H. W. 1 Ziegler, J. F. 1 Ziegler, Matthias D. 1 see all ... less ...

channeling 3 ion beam solid interaction 3 atomic collision 2 electron microprobe analysis 2 sputtering 2 Auger effect 1 more ... SIMS (secondary ion mass spectroscopy) 1 ion beam 1 ion beam analysis 1 ion optics 1 ion scattering 1 ion source 1 isotope effect 1 positron annihilation 1 radiation damage 1 secondary emission 1 stopping power 1 see all ... less ...

FGGJ - Ion beam analysis, ion beam solid interaction FAAB - Solid state physics - reference books 3 FFGH - Electron emission, field emission 2 FGGB - Ion implantation, ion beam synthesis 2 FHJC - Microbeam analysis 2 FDF - Radiation effects in solids 1 more ... FFGC - Electron spectroscopy 1 FGG - Ion beam technology 1 FGGE - Ion beam surface modification 1 FHAB - Surface and thin film characterization 1 see all ... less ...

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