1
High-Resolution X-Ray Scattering from Thin Films and Multilayers [E-Book] /

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Radiation Effects in Advanced Semiconductor Materials and Devices [E-Book] /

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Semiconductor Interfaces [E-Book] : Formation and Properties /

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X-Ray Microscopy and Spectromicroscopy [E-Book] : Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996 /

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