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Bolten, D.
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Waser, R.
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
2002
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Bolten, D.
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Waser, R.
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
2002
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1
Journal Article
Interface-related decrease of the permittivity in PbZrxTi1-xO3 thin films
Grossmann, M.
2002
Applied physics letters, 80 (2002) S. 1427 - 1429
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The interface screening model as origin of imprint in PbZrxTi1-xO3 thin films. II. Numerical simulation and verification
Grossmann, M.
2002
Journal of applied physics, 92 (2002) S. 2688 - 2696
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3
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Influence of defects on the properties of a 2D ferroelectric: A Monte-Carlo simulation study
Bolten, D.
2002
Japanese journal of applied physics, 41 (2002) S. 7202 - 7210
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The interface screening model as origin of imprint in PbZrx/Ti1-x/O3 thin films 1 : dopant, illumination, and bias dependence
Grossmann, M.
2002
Journal of applied physics, 92 (2002) S. 2680 -2687
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(Pb1-xBax)TiO3 thin films prepared by liquid delivery MOCVD : influence of the process parameters on film formation and electrical properties
Ritter, S.
2002
Ferroelectrics, 268 (2002) S. 143 - 148
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Bolten, D.
Waser, R.
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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Elektrokeramische Materialien; IFF-EKM
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