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Elektrokeramische Materialien; IFF-EKM
Ellerkmann, U.
Poster
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Elektrokeramische Materialien; IFF-EKM
Ellerkmann, U.
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Scaling of Pb(Zr,Ti)O3 thin films by the CSD method with a thickness down to 50 nm and nanosized top electrodes
Ellerkmann, U.
2003
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Influence of electrode material on the interfacial capacitance and the failure mechanisms in PZT thin films
Ellerkmann, U.
2002
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Böttger, U.
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Ellerkmann, U.
Schneller, T.
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Waser, R.
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Bruchhaus, R.
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Nagel, D. R.
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Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik
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