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Poster
Ionentechnik
Holländer, Bernhard
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Ionentechnik
Holländer, Bernhard
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Select result number 1
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Poster
Strain relaxation of He+ implanated pseudomorphic Si(1-X)GeX layers on Si(100)
Holländer, B.
2001
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New high-precision 5-Axis RBS/channeling goniometer for ion beam analysis of 150 mm wafers
Holländer, B.
1999
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Holländer, Bernhard
Mantl, S.
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Fichtner, P. F. P.
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Hackbarth, T.
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Halling, H.
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Heer, H.
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Herzog, H.-J.
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Kirch, D.
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Lenk, Steffi
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Luysberg, Martina
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Ionentechnik
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Institut für Bio- und Chemosensoren; ISG-2
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Institut für Medizin; IME
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Institut für Schicht- und Ionentechnik; ISI
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Mikrostrukturforschung; IFF-IMF
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