181
Quantitative surface analysis of materials : Symposium on progress in quantitative surface analysis : Pittsburgh conference on analytical chemistry and applied spectroscopy 0028 : Cleveland, OH, 02.03.77-03.03.77.
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182
Electron and ion spectroscopy of solids : Based on the lectures pres. at the NATO Advanced Study Institute : Gent, 29.08.77-09.09.77 /
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183
Mikroanalyse mit Elektronen- und Ionensonden /
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184
Prüfung der Anwendbarkeit moderner grenzflächenphysikalischer Analysenverfahren zur gezielten Lösung von Katalysatorproblemen am Beispiel der katalytischen Reduktion von Stickstoffmonoxid : Abschlussbericht.
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Seidl, M.
1977
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185
Characterization of metal and polymer surfaces. vol 0001 : Metal surfaces : Advances in characterization of metal and polymer surfaces: symposium : New-York, NY, 05.04.76-08.04.76.
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Lee, L.
1977
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186
Characterization of metal and polymer surfaces. vol 0002 : Polymer surfaces : Advances in characterization of metal and polymer surfaces: symposium : New-York, NY, 05.04.76-08.04.76.
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Lee, L.
1977
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187
Electron spectroscopy for surface analysis /
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188
Surface analysis techniques for metallurgical applications : symposium on surface analysis techniques for metallurgical applications : Pittsburgh analytical conference : Cleveland, OH, 04.03.75
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189
Experimental methods in catalytic research. 3. Characterization of surface and adsorbed species /
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190
Methods of surface analysis /
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191
Moderne Verfahren der Oberflächenanalyse : Dechema/DAGV Symposion Moderne Verfahren der Oberflächenanalyse: Vorträge : Frankfurt, 04.12.1972-05.12.1972.
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192
Characterization of solid surfaces /
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193
Moderne Methoden zur Oberflächenanalyse von Festkörpern.
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194
Internationales Symposium moderne Verfahren der Oberflächenanalyse : International symposium modern methods of surface analysis : Frankfurt, 04.12.72-05.12.72.
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1972
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195
Structure et proprietes des surfaces des solides : Paris, 07.07.1969-11.07.1969.
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1970
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196
Clean surfaces : Their preparation and characterization for interfacial studies : based on a symposium, : Raleigh, NC, 08.04.1968-10.04.1968.
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197
Physical measurement and analysis of thin films : Eastern analytical symposium: 8 papers : New-York, NY, 08.11.67-10.11.67.
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Abbildung von Oberflächen mit Elektronen, Ionen und Röntgenstrahlen ..
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199
Measurement techniques for thin films : Reprint : Electrochemical Society: national meeting 1965 : Electrochemical Society: national meeting 1966 : Buffalo, NY, Philadelphia, PA, 11.10.65-11.10.66 ; 10.10.66.
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Applied surface analysis: proceedings of the symposium. 0008 : Dayton, OH, 04.06.1986-06.06.1986.
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