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Microelectronics.
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Measurement.
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1
E-Book
Microscopy of Semiconducting Materials 2007 [E-Book] /
Cullis, A. G.
2008
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2
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Integrated Chemical Microsensor Systems in CMOS Technology [E-Book] /
Hierlemann, Andreas.
2005
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Microscopy of Semiconducting Materials [E-Book] : Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK /
Cullis, A. G.
2005
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4
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Mechanical Microsensors [E-Book] /
Elwenspoek, Miko
2001
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Available as
Electronic Edition
4
Material Type
Book
4
Type of Literature
Conference Publication
1
Year of Publication
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Location
ZB
4
Name
Cullis, A. G.
2
Baltes, H.
1
Elwenspoek, Miko
1
Fujita, Hiroyuki.
1
Hierlemann, Andreas.
1
Hutchison, J. L.
1
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Liepmann, Dorian.
1
Midgley, P. A.
1
Wiegerink, Remco
1
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Subject
Electronics.
4
Materials science.
4
Measurement.
Microelectronics.
Physical measurements.
4
Microscopy.
2
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Nanotechnology.
2
Solid state physics.
2
Spectroscopy.
2
Analytical chemistry.
1
Control engineering.
1
Electronic circuits.
1
Electronic materials.
1
Materials
1
Mechanics, Applied.
1
Mechanics.
1
Mechatronics.
1
Optical materials.
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Robotics.
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Thin films.
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