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High spatial resolution and three-dimensional measurement of charge density and electric field in nanoscale materials using off-axis electron holography /
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Characterization of materials. 2.
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Analysis of microelectronic materials and devices.
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Advances in materials characterization : Proceedings of a conf : Alfred, NY, 15.08.1982-18.08.1982 /
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Australian conference on nuclear techniques of analysis 0003: proceedings : Lucas-Heights, 01.11.83-03.11.83.
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