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Landolt-Börnstein. 7 Madelung, O. 7 Bean, J. C. 3 Kasper, E. 3 Chizhikov, D. M. 2 Fauchet, P. M. 2 more ... Glazov, Vasilij Mikhajlovich. 2 Grabmaier, J. 2 Khattak, C. P. 2 Landolt-Börnstein 2 Schastlivyi, Viktor Petrovich. 2 Schulz, M. 2 Thönissen, Markus 2 Zemskov, V. S. 2 Adachi, S. 1 Aerts, E. 1 Albrecht, Martin 1 Amato, Giampiero 1 Ambros, Stefan 1 Amelinckx, Severin 1 Ammerlaan, C. A. J. 1 Anderson, Joseph Chapman 1 Arens-Fischer, Rüdiger 1 Aseev, Aleksandre Leonidovic 1 Backes, Ulrich 1 Bardeleben, H.-J. von 1 Bartsch, Heinz 1 Behren, Jens von. 1 Berger, Michael Götz 1 Bimberg, D. 1 see all ... less ...

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FJKB - Elemental semiconductors 134 FGCD - Crystal growth of specific substances 21 FAAB - Solid state physics - reference books 19 FJEC - Amorphous semiconductors 15 FFPE - Thin film electronic properties, semiconductor interfaces 10 FJHE - Defects and radiation effects in semiconductors 10 more ... FJK - Specific semiconductor materials 9 FJKC - III - V semiconductors 9 FAF - Materials research - comprehensive works 8 FFPG - Multilayer systems, quantum structures 8 FGK - Thin film technology, epitaxy 7 FJLB - Physics of semiconductor devices 7 FJNH - Excited states in solids 6 FFGC - Electron spectroscopy 5 FGKC - Vacuum deposition, MBE 5 FGM - Microelectronic technology 5 FNPD - Hard materials, refractory compounds 5 FEJP - Porous media, capillarity 4 FJKD - Compound semiconductors 4 FGKJ - Plasma processing, etching 3 FJNE - Active centers in solids 3 FDKB - Diffusion in condensed matter 2 FGGB - Ion implantation, ion beam synthesis 2 FGMH - Metallization, physics of microelectronics 2 FGML - Characterization of electronic materials 2 FHAB - Surface and thin film characterization 2 FHEG - Tunneling microscopy, force microscopy 2 FHLB - Soft X-ray spectroscopy 2 FJNC - Optical spectroscopy in solids 2 CBR - Inorganic synthesis and reactions of metals and their compounds 1 see all ... less ...

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