1
Sekundärionenmassenspektrometrie und Neutralteilchenmassenspektrometrie an oxidischen Dünnschichtsystemen: der Einfluss ionenbeschussindizierter Prozesse auf die Sekundärteilchenemission im Zerstäubungsgleichgewicht und an Schichtgrenzflächen.
Book
Subject (ZB): “...mass spectroscopy...”
Loan/Reservation

Favorites
Saved in:
2
Encyclopedia of materials characterization : surfaces, interfaces, thin films /
Book
Subject (ZB): “...spectroscopy...”
Loan/Reservation

Favorites
Saved in:
3
Practical surface analysis . 1 . Auger and x-ray photoelectron spectroscopy
Book
Briggs, D.
1990
Subject (ZB): “...photoelectron spectroscopy...”
Loan/Reservation

Favorites
Saved in:
4
Secondary ion mass spectroscopy : principles and applications.
Book
Subject (ZB): “...SIMS (secondary ion mass spectroscopy)...”
Loan/Reservation

Favorites
Saved in:
5
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
Book
Subject (ZB): “...SIMS (secondary ion mass spectroscopy)...”
Loan/Reservation

Favorites
Saved in:
6
Secondary ion mass spectrometry: international conference 0005: proceedings : SIMS 0005: proceedings : Washington, DC, 30.09.1985-04.10.1985.
Book
Subject (ZB): “...SIMS (secondary ion mass spectroscopy)...”
Loan/Reservation

Favorites
Saved in:
7
Secondary ion mass spectrometry: international conference 0004: proceedings : SIMS 0004: proceedings : Osaka, 13.11.1983-19.11.1983.
Book
Subject (ZB): “...SIMS (secondary ion mass spectroscopy)...”
Loan/Reservation

Favorites
Saved in:
8
Secondary ion mass spectrometry: international conference 0002 : SIMS 0002 : Stanford, CA, 27.08.79-31.08.79.
Book
Subject (ZB): “...SIMS (secondary ion mass spectroscopy)...”
Loan/Reservation

Favorites
Saved in:

Narrow Search Results