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Mayer, James W.
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Feldman, Leonard C.
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Mayer, James W.
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1
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Electronic thin film science : for electrical engineers and materials scientists /
Tu, King-Ning
1992
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2
Book
Fundamentals of nanoscale film analysis /
Alford, Terry L.
2007
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3
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"Fundamentals of nanoscale film analysis [E-Book] /
Alford, Terry L.
2007
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4
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Fundamentals of Nanoscale Film Analysis [E-Book] /
Alford, Terry L.
2007
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5
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Fundamentals of surface and thin film analysis /
Feldman, Leonard C.
1986
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6
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Materials analysis by ion channeling : submicron crystallography /
Feldman, Leonard C.
1982
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7
E-Book
New Uses of Ion Accelerators [E-Book] /
Cahill, Thomas A.
1975
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4
Electronic Edition
3
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Book
7
Type of Literature
Handbook, Textbook
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ZB
7
IBN-1-2
1
IBN-3-4
1
IEK-5
1
Name
Feldman, Leonard C.
Mayer, James W.
Alford, Terry L.
3
Cahill, Thomas A.
1
Cairns, James A.
1
Chu, Wei-Kan
1
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Crowder, Billy L.
1
Dearnaley, Geoffrey
1
Kessel, Quentin
1
Meyer, Otto
1
Picraux, S. T.
1
Picraux, Samuel T.
1
Smith, Winthrop W.
1
Tu, King-Ning
1
Wolicki, Eligius A.
1
Ziegler, James F.
1
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Materials
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Solid state physics.
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Spectroscopy.
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Thin films.
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ion channeling
1
materials characterization
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stress analysis
1
surface analysis
1
surface diffusion
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surface electronic properties
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surface energy
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thin film
1
thin film physics
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Classification
FHAB - Surface and thin film characterization
2
FFP - Physics of thin films
1
FGGJ - Ion beam analysis, ion beam solid interaction
1
Language
English
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