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IBN-1-2
FGGJ - Ion beam analysis, ion beam solid interaction
Print Edition
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IBN-1-2
FGGJ - Ion beam analysis, ion beam solid interaction
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1
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Backscattering spectrometry /
Chu, Wei-Kan
1978
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2
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Ion beam handbook for material analysis /
Mayer, James W.
1977
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3
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Materials analysis by ion channeling : submicron crystallography /
Feldman, Leonard C.
1982
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4
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Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis.
Wilson, R. G.
1989
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5
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Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
Benninghoven, Alfred
1987
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6
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Secondary ion mass spectrometry : International Conference on Secondary Ion Mass Spectrometry. 0006: proceedings : SIMS. 0006: proceedings : Versailles, 13.09.87-18.09.87.
Benninghoven, A.
1988
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7
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Secondary ion mass spectroscopy : principles and applications.
Vickerman, John C.
1989
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Print Edition
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7
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Conference Publication
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IBN-1-2
ZB
7
IEK-14
4
IEK-4
1
Name
Mayer, James W.
3
Benninghoven, A.
1
Benninghoven, Alfred
1
Chu, Wei-Kan
1
Feldman, Leonard C.
1
Magee, C. W.
1
more ...
Nicolet, Marc-A.
1
Picraux, S. T.
1
Rimini, E.
1
Rüdenauer, Friedrich G.
1
Stevie, F. A.
1
Vickerman, John C.
1
Werner, H. W.
1
Wilson, R. G.
1
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Subject
SIMS (secondary ion mass spectroscopy)
2
depth profiling
1
ion channeling
1
Classification
FGGJ - Ion beam analysis, ion beam solid interaction
FAAB - Solid state physics - reference books
1
Language
English
2
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