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1

Contribution to a conference proceedings
Journal Article

Electric and Magnetic Field Mapping With the pnCCD (S)TEM Camera

Huth, M.
2016

Microscopy and microanalysis, 22 (2016) S3, S. 256 - 257

“...Ryll, H....”
OpenAccess

2

Contribution to a conference proceedings

Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors

Müller - Caspary, K.
2016

“...Ritz, R....”

3

Contribution to a conference proceedings
Journal Article

Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM

Simson, M.
2016

Microscopy and microanalysis, 22 (2016) S3, S. 512 - 513

“...Yang, H....”
OpenAccess

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