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Books & more: Hits 1 - 14 of 14

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Sputtering by particle bombardment : experiments and computer calculations from threshold to MeV energies /

Behrisch, Rainer.
2007

Subject (ZB): “...thin film technology...”

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Principles of plasma discharges and materials processing /

Lichtenberg, Allan J.
2005

Subject (ZB): “...thin film technology...”

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Physical processes of the interaction of fusion plasmas with solids.

Hofer, Wolfgang Otto
1996

Subject (ZB): “...thin film...”

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Handbook of modern ion beam materials analysis /

Tesmer, Joseph R.
1995

Subject (ZB): “...thin film...”

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Practical surface analysis . 2 . Ion and neutral spectroscopy /

Briggs, D.
1992

“...FHAB - Surface and thin film characterization...”

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Sputtering by particle bombardment vol 0003: characteristics of sputtered particles, technical applications.

Behrisch, R.
1991

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Physical chemistry of surfaces /

Adamson, Arthur W.
1990

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Practical surface analysis . 1 . Auger and x-ray photoelectron spectroscopy

Briggs, D.
1990

“...FHAB - Surface and thin film characterization...”

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Handbook of ion beam processing technology : principles, deposition, film modification, and synthesis /

Cuomo, Jerome J.
1989

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Solid state physics : surfaces.

Park, R. L.
1985

“...FHAB - Surface and thin film characterization...”

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Metallurgical coatings : papers presented at the international conference. 1979, pt 01 : San-Diego, CA, 23.04.79-27.04.79.

1979

“...Thin solid films ;...”

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Metallurgical coatings : papers presented at the international conference. 1979, pt 02 : San-Diego, CA, 23.04.79-27.04.79.

1979

“...Thin solid films ;...”

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Thin film processes /

Vossen, John L.
1978

“...FGK - Thin film technology, epitaxy...”

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Book

Thin-film optical filters /

MacLeod, H. A.
1969

Subject (ZB): “...thin film...”

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Print Edition 14

Book 14

Handbook, Textbook 3 Conference Publication 2

From:

To:

IEK-4 ZB IBN-3-4 3 IBN-1-2 2 IEK-14 2 IFF 2 more ... IBG-3 1 IEK-8 1 IKP 1 see all ... less ...

Briggs, D. 2 Adamson, Arthur W. 1 Barbour, J. Charles 1 Behrisch, R. 1 Behrisch, Rainer. 1 Cuomo, Jerome J. 1 more ... Hofer, Wolfgang Otto 1 Kern, Werner. 1 Lichtenberg, Allan J. 1 Lieberman, Michael E. 1 MacLeod, H. A. 1 Maggiore, Carl J. 1 Mayer, James W. 1 Nastasi, Michael 1 Park, R. L. 1 Tesmer, Joseph R. 1 Vossen, John L. 1 see all ... less ...

sputtering 3 thin film 3 ion beam analysis 2 metal coating 2 surface analysis 2 thin film technology 2 more ... Auger electron spectroscopy 1 Tokamak device 1 accelerator 1 activation analysis 1 backscattering 1 channeling 1 charged particle 1 chemical vapor deposition 1 coating 1 control 1 discharge 1 electron emission 1 energy loss 1 erosion 1 film deposition 1 hot plasma 1 instrumentation 1 interface phenomena 1 ion implantation 1 liquid solid interface 1 optical filter 1 particle 1 photoelectron spectroscopy 1 plasma etching 1 see all ... less ...

FGK - Thin film technology, epitaxy 3 FHAB - Surface and thin film characterization 3 FGGJ - Ion beam analysis, ion beam solid interaction 2 FPUG - Special purpose coatings 2 FANE - Computational solid state physics 1 FFGC - Electron spectroscopy 1 more ... FFM - Liquid interfaces, adhesion 1 FGG - Ion beam technology 1 FGKC - Vacuum deposition, MBE 1 FGKJ - Plasma processing, etching 1 FJP - Optical materials, crystal optics 1 PGA - Plasma physics 1 PGLJ - Plasma wall interaction, divertors 1 see all ... less ...

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