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Nanotechnology.
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scanning probe microscopy
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Electronic Edition
English
Nanotechnology.
AND
scanning probe microscopy
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1
E-Book
Noncontact Atomic Force Microscopy [E-Book] /
Meyer, E.
2002
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2
E-Book
Noncontact Atomic Force Microscopy [E-Book] : Volume 3 /
Giessibl, Franz J.
2015
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3
E-Book
Scanning Probe Microscopy [E-Book] : Atomic Force Microscopy and Scanning Tunneling Microscopy /
Voigtländer, Bert.
2015
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4
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Atomic Force Microscopy [E-Book] /
Voigtländer, Bert
2019
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5
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Electrical Atomic Force Microscopy for Nanoelectronics [E-Book] /
Celano, Umberto
2019
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6
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CMOS Cantilever Sensor Systems [E-Book] : Atomic Force Microscopy and Gas Sensing Applications /
Lange, D.
2002
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7
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching [E-Book] : Application to Rough and Natural Surfaces /
Kaupp, Gerd.
2006
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8
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Noncontact Atomic Force Microscopy [E-Book] : Volume 2 /
Giessibl, Franz J.
2009
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9
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Ferroelectric Domain Walls [E-Book] : Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy /
Guyonnet, Jill
2014
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Electronic Edition
Material Type
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9
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Handbook, Textbook
1
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ZB
9
Name
Giessibl, Franz J.
2
Morita, Seizo.
2
Wiesendanger, Roland.
2
Baltes, H.
1
Brand, O.
1
Celano, Umberto
1
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Guyonnet, Jill
1
Kaupp, Gerd.
1
Lange, D.
1
Meyer, E.
1
Meyer, Ernst.
1
Morita, S.
1
Voigtländer, Bert
1
Voigtländer, Bert.
1
Wiesendanger, R.
1
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Subject
Nanotechnology.
force microscopy
9
scanning probe microscopy
Engineering.
5
Materials science.
2
Measurement.
2
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Microscopy.
2
Optical materials.
2
Physical measurements.
2
Physics.
2
Surfaces (Physics).
2
Condensed matter.
1
Control engineering.
1
Electronics.
1
Materials
1
Mechanics, Applied.
1
Mechanics.
1
Mechatronics.
1
Optics.
1
Optoelectronics.
1
Physical chemistry.
1
Plasmons (Physics).
1
Robotics.
1
Science.
1
Spectroscopy.
1
Thin films.
1
nanoelectronics
1
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Classification
FHEG - Tunneling microscopy, force microscopy
1
Language
English
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