121
Surface physics : China Center of Advanced Science and Technology (world laboratory) symposium/workshop proceedings vol 0009 : CCAST (world laboratory) symposium/workshop proceedings vol 0009 : Beijing, 27.05.91-31.05.91.
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Li, X.
1992
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122
Surface X-ray and neutron scattering: international conference 0002: proceedings : Bad-Honnef, 25.06.91-28.06.91.
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Zabel, H.
1992
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123
Dünnschichttechnologien 1992: Statusseminar : Dünnschichttechnologien: Statusseminar 0003 : 01.06.92-03.06.92 : Berichte zu F und E Projekten aus dem Förderbereich Physikalische Technologien des Bundesministers für Forschung und Technologie.
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124
Surface analysis methods in materials science.
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1992
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125
Sensitivity of optical measurements on planar stratified structures and reduction of experimental data.
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126
Arbeitstagung angewandte Oberflächenanalytik. 7 : Kurzfassung der Vorträge der 7. Arbeitstagung vom 22. - 25. Juni 1992 im Forschungszentrum Jülich /
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127
Practical surface analysis . 2 . Ion and neutral spectroscopy /
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Briggs, D.
1992
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128
Electron energy loss spectrometers : the technology of high performance /
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129
Analysis of microelectronic materials and devices.
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130
Instrumental surface analysis of geologic materials /
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131
Vacuum and surface analysis. vol 0003 : Sino - German joint seminar on vacuum and surface analysis: proceedings : VASA. 1988: proceedings : Shanghai, 21.10.88-23.10.88.
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Hua, Z. Y.
1990
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132
Chemistry and physics of solid surfaces. 0008 : International summer institute in surface science. 0009: review articles : ISISS. 1989: review articles : Milwaukee, WI, 08.89.
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Surface and interface analysis of microelectronic materials processing and growth: meeting: proceedings : Santa-Clara, CA, 12.10.89-13.10.89.
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134
Dünnschichttechnologien 1990 : Statusseminar Vol 1 : 27.06.90-29.06.90 : Berichte zu F und E Projekten aus dem Förderbereich Physikalische Technologien des Bundesministers für Forschung und Technologie.
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Surface analysis techniques and applications : papers presented at an international symposium U.M.I.S.T., Manchester, 11-13th September 1989 /
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Neagle, W.
1990
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136
Practical surface analysis . 1 . Auger and x-ray photoelectron spectroscopy
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Briggs, D.
1990
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137
Methods of surface analysis /
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Introduction to surface roughness and scattering /
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139
Surface and interface characterization by electron optical methods : NATO advanced study institute on the study of surfaces and interfaces by electron optical techniques: proceedings : Erice, 04.04.87-15.04.87 /
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Howie, A.
1988
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140
Vacuum and surface analysis. vol 0001 : Chinese Japanese Joint Seminar on Vacuum and Surface Analysis: proceedings : VASA : 1985: proceedings : Shanghai, 26.10.85-28.10.85.
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Hua, Z.
1988
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