Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Nanotechnology.
Reset Filters
Show filters (1)
Nanotechnology.
Ask a Librarian
Books & more
: Hits
1 - 10
of
10
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
E-Book
Atomic Force Microscopy [E-Book] /
Voigtländer, Bert
2019
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 2
2
E-Book
Electrical Atomic Force Microscopy for Nanoelectronics [E-Book] /
Celano, Umberto
2019
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 3
3
E-Book
Noncontact Atomic Force Microscopy [E-Book] : Volume 3 /
Giessibl, Franz J.
2015
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 4
4
E-Book
Scanning Probe Microscopy [E-Book] : Atomic Force Microscopy and Scanning Tunneling Microscopy /
Voigtländer, Bert.
2015
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 5
5
E-Book
Ferroelectric Domain Walls [E-Book] : Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy /
Guyonnet, Jill
2014
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 6
6
E-Book
Nanotechnology for sustainable energy [E-Book] /
Hu, Yun Hang
2013
Subject (ZB):
“
...
Scanning
probe
microscopy
....
”
Full text
Favorites
Saved in:
QR Code
Select result number 7
7
E-Book
Noncontact Atomic Force Microscopy [E-Book] : Volume 2 /
Giessibl, Franz J.
2009
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 8
8
E-Book
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching [E-Book] : Application to Rough and Natural Surfaces /
Kaupp, Gerd.
2006
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 9
9
E-Book
Noncontact Atomic Force Microscopy [E-Book] /
Meyer, E.
2002
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
Full text
Favorites
Saved in:
QR Code
Select result number 10
10
E-Book
CMOS Cantilever Sensor Systems [E-Book] : Atomic Force Microscopy and Gas Sensing Applications /
Lange, D.
2002
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
Full text
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Electronic Edition
10
Material Type
Book
10
Type of Literature
Handbook, Textbook
1
Theses
1
Conference Publication
1
Year of Publication
From:
To:
Location
ZB
10
Name
Giessibl, Franz J.
2
Morita, Seizo.
2
Wiesendanger, Roland.
2
Baltes, H.
1
Brand, O.
1
Burghaus, U.
1
more ...
Celano, Umberto
1
Guyonnet, Jill
1
Hu, Yun Hang
1
Kaupp, Gerd.
1
Lange, D.
1
Meyer, E.
1
Meyer, Ernst.
1
Morita, S.
1
Qiao, Shizhang
1
Voigtländer, Bert
1
Voigtländer, Bert.
1
Wiesendanger, R.
1
see all ...
less ...
Subject
Nanotechnology.
force microscopy
9
scanning probe microscopy
9
Engineering.
5
Materials science.
2
Measurement.
2
more ...
Microscopy.
2
Optical materials.
2
Physical measurements.
2
Physics.
2
Surfaces (Physics).
2
Butane -- Absorption and adsorption.
1
Carbon nanofibers.
1
Condensed matter.
1
Control engineering.
1
Dye-sensitized solar cells.
1
Electric batteries.
1
Electrocatalysis.
1
Electronics.
1
Energy storage.
1
Heterostructures -- Electric properties.
1
Lithium cells -- Structure.
1
Lithium ion batteries -- Analysis.
1
Lithium ion batteries -- Materials.
1
Lithography, Electron beam -- Industrial applications.
1
Materials
1
Mechanics, Applied.
1
Mechanics.
1
Mechatronics.
1
Nanopores.
1
see all ...
less ...
Classification
FHEG - Tunneling microscopy, force microscopy
1
Language
English
10
×
Loading...