21
The spectroscopy of semiconductors /
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Aufbau eines LBIC-(light beam induced current) Meßplatzes für amorphe Siliziumsolarzellen [E-Book] /
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Microscopy of semiconducting materials 1991 : Conference on the microscopy of semiconducting materials: proceedings : Institute of Physics conference: proceedings : Oxford, 25.03.91-28.03.91.
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Analysis of microelectronic materials and devices.
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Measurement of high speed signals in solid state devices.
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Semiconductor material and device characterization /
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Point and extended defects in semiconductors : NATO advanced research workshop/international school of materials science and technology workshop on point, extended and surface defects in semiconductors. 0002 : Erice, 02.11.88-07.11.88 /
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Surface and interface analysis of microelectronic materials processing and growth: meeting: proceedings : Santa-Clara, CA, 12.10.89-13.10.89.
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Growth and characterisation of semiconductors : papers contributing to a short course /
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The electrical characterization of semiconductors : measurement of minority carries properties.
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Electrical characterization of gaas materials and devices.
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32
Mechanische Relaxationsspektroskopie an Aluminium Metallisierungsschichten für die Mikroelektronik [E-Book] /
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Microscopy of semiconducting materials. 1989 : Royal Microscopical Society conference: proceedings : Conference on the microscopy of semiconducting materials: proceedings : Oxford, 10.04.89-13.04.89.
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Highlights on spectroscopies of semiconductors and insulators : Castro Marina, Italy, September 1987 /
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Semiconductor silicon: materials science and technology : Summer school on silicon: materials science and technology: proceedings : International school of materials science and technology course 0016 : Erice, 03.07.88-15.07.88.
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Evaluation of advanced semiconductor materials by electron microscopy : NATO advanced research workshop on the evaluation of advanced semiconductor materials by electron microscopy: proceedings : Bristol, 12.09.88-17.09.88 /
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Cherns, D.
1989
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Spectroscopy of semiconductor microstructures : NATO advanced research workshop on spectroscopy of semiconductor microstructures: proceedings : Venezia, 09.05.89-13.05.89 /
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Fasol, G.
1989
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Characterization of semiconductor materials. principles and methods1.
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SEM microcharacterization of semiconductors.
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Anwendung der hochauflösenden Elektronenenergieverlustspektroskopie zum Studium von Halbleiterschichtsystemen [E-Book] /
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