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2019
Controlling Electron Charge-Based Phenomena
Halbleiter-Nanoelektronik; PGI-9
Schubert, Jürgen
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2019
Controlling Electron Charge-Based Phenomena
Halbleiter-Nanoelektronik; PGI-9
Schubert, Jürgen
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1
Journal Article
Optical and structural characterization of orthorhombic LaLuO3 using extreme ultraviolet reflectometry
Tryus, Maksym
2019
Thin solid films, 680 (2019) S. 94 - 101
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2
Journal Article
Development of a Combined pH‐ and Redox‐Sensitive Bi‐Electrode Glass Thin‐Film Sensor
Iken, Heiko
2019
Physica status solidi / A Applied research A, 216 (2019) 12, S. 1900114
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3
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Determination of energy thresholds of electron excitations at semiconductor/insulator interfaces using trap-related displacement currents
Afanas'ev, V. V.
2019
Microelectronic engineering, 215 (2019) S. 110992 -
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4
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Self-assembly and properties of domain walls in BiFeO3 layers grown via molecular-beam epitaxy
Mei, Antonio B.
2019
APL materials, 7 (2019) 7, S. 071101 -
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Transient negative capacitance and charge trapping in FDSOI MOSFETs with ferroelectric HfYOX
Han, Qinghua
2019
Solid state electronics, 159 (2019) S. 71 - 76
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6
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Subthreshold Behavior of Floating-Gate MOSFETs With Ferroelectric Capacitors531
Han, Qinghua
2018
IEEE transactions on electron devices, 65 (2018) 10, S. 4641 - 4645
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Schubert, Jürgen
Aleksa, Paulus
2
Han, Qinghua
2
Mantl, Siegfried
2
Zhao, Qing-Tai
2
Afanas'ev, V. V.
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Makhotkin, Igor A.
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Nikolaev, Konstantin V.
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Ralph, Daniel C.
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Schlom, Darrell G.
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Schroeder, Uwe
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Research Program
Controlling Electron Charge-Based Phenomena
Contributing Institute
Halbleiter-Nanoelektronik; PGI-9
JARA-FIT; JARA-FIT
6
Bioelektronik; ICS-8
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2019
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