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Books & more: Hits 1 - 20 of 24

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Analysis of microelectronic materials and devices.

Grasserbauer, Manfred
1991

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Encyclopedia of materials characterization : surfaces, interfaces, thin films /

Brundle, C. Richard
1992

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Ergebnisse der exakten Naturwissenschaften.

Flügge, S.
1964

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Hydrogen safety for energy applications : engineering design, risk assessment, and codes and standards /

Kotchourko, Alexei
2022

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Nanobiotechnology : concepts, applications and perspectives /

Niemeyer, Christof M.
2004

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Practical surface analysis . 1 . Auger and x-ray photoelectron spectroscopy

Briggs, D.
1990

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Practical surface analysis . 2 . Ion and neutral spectroscopy /

Briggs, D.
1992

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Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis.

Wilson, R. G.
1989

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Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /

Benninghoven, Alfred
1987

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Secondary ion mass spectrometry: international conference 0002 : SIMS 0002 : Stanford, CA, 27.08.79-31.08.79.

Benninghoven, A.
1979

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Secondary ion mass spectrometry: international conference 0003: proceedings : SIMS 0003: proceedings : Budapest, 30.08.81-05.09.81.

Benninghoven, A.
1982

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Secondary ion mass spectrometry: international conference 0004: proceedings : SIMS 0004: proceedings : Osaka, 13.11.1983-19.11.1983.

Benninghoven, A.
1984

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Secondary ion mass spectrometry: international conference 0005: proceedings : SIMS 0005: proceedings : Washington, DC, 30.09.1985-04.10.1985.

Benninghoven, A.
1986

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Secondary ion mass spectrometry : International Conference on Secondary Ion Mass Spectrometry. 0006: proceedings : SIMS. 0006: proceedings : Versailles, 13.09.87-18.09.87.

Benninghoven, A.
1988

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Secondary ion mass spectroscopy : principles and applications.

Vickerman, John C.
1989

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Sekundärionenmassenspektrometrie und Neutralteilchenmassenspektrometrie an oxidischen Dünnschichtsystemen: der Einfluss ionenbeschussindizierter Prozesse auf die Sekundärteilchenem...

Lipinsky, Dieter.
1995

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Book

Taschenbuch der Mathematik

Bronshtejn, Il'ja N.
1980

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Taschenbuch der Mathematik : Ergänzung

Bronshtejn, Il'ja N.
1980

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Book

Thin film and depth profile analysis.

Oechsner, H.
1984

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Book

Transmission electron microscopy : a textbook for materials science . 1 . Basics /

Williams, David B.
2009

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Print Edition 24

Book 24

Handbook, Textbook 8 Conference Publication 5 Encyclopedia 1

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To:

IEK-14 ZB 14 IBN-1-2 5 IBG-1 2 IEK-4 2 IEK-8 2 more ... IBN-3-4 1 IFF 1 see all ... less ...

Benninghoven, A. 5 Carter, C. Barry 4 Williams, David B. 4 Briggs, D. 2 Bronshtejn, Il'ja N. 2 Benninghoven, Alfred 1 more ... Brundle, C. Richard 1 Etzkorn, H. W. 1 Flügge, S. 1 Grasserbauer, Manfred 1 Grosche, G. 1 Grosche, Günter 1 Hund, Friedrich 1 Jordan, Thomas 1 Kotchourko, Alexei 1 Lipinsky, Dieter. 1 Magee, C. W. 1 Niemeyer, Christof M. 1 Oechsner, H. 1 Rüdenauer, Friedrich G. 1 Semendyaev, Konstantin A. 1 Stevie, F. A. 1 Vickerman, John C. 1 Werner, H. W. 1 Wilson, R. G. 1 see all ... less ...

SIMS (secondary ion mass spectroscopy) 5 surface analysis 5 diffraction 4 imaging technique 4 transmission electron microscopy 4 scattering 3 more ... secondary ion emission 3 spectrometer 3 electron source 2 materials characterization 2 Auger electron spectroscopy 1 accident 1 biotechnology 1 chemical analysis 1 depth profiling 1 elastic scattering 1 electron scattering 1 hydrogen 1 hydrogen production 1 hydrogen storage 1 hydrogen transport 1 industrial safety 1 inelastic scattering 1 ion beam analysis 1 mass spectroscopy 1 microanalysis 1 microelectronics 1 nanotechnology 1 photoelectron spectroscopy 1 risk assessment 1 see all ... less ...

FGGJ - Ion beam analysis, ion beam solid interaction 10 FHAB - Surface and thin film characterization 5 FHG - Electron microscopy 4 FHA - Materials characterization - general aspects 2 MAK - Mathematics - formulae, tables 2 CTA - Chemical analysis - comprehensive works 1 more ... CTF - Chemical analytical methods 1 CUW - Mass spectroscopy 1 CXX - Hydrogen production - chemistry and technology 1 FAF - Materials research - comprehensive works 1 FFGC - Electron spectroscopy 1 FGML - Characterization of electronic materials 1 FGN - Nanotechnology 1 LTE - Biotechnology - general aspects 1 TIG - Reliability, safety, quality control 1 see all ... less ...

English 3 German 2

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