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1

Journal Article

Phase diagrams and physical properties of single-domain epitaxial Pb(Zr1-xTix)O3 thin films

Pertsev, N. A.
2003

Physical Review B Physical review / B, 67 67 (2003 2003) 5 5, S. 054107 054107

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2

Journal Article

Introduction and characterization of interfacial defects in SrRuO3/BaTiO3/SrRuO3 multilayer films

Jia, C. L.
2003

Journal of crystal growth, 247 (2003) S. 381

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3

Journal Article

Towards the limit of ferroelectric nanosized grains

Roelofs, A.
2003

Nanotechnology, 14 (2003) S. 250 - 253

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4

Journal Article

Frequency and temperature dependence of the relative permittivity in ferroelectrics: Monte-Carlo simulation study

Bolten, D.
2003

Journal of applied physics, 93 (2003) S. 2890 - 2894

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5

Journal Article

Reversible and irreversible polarization processes in ferroelectric ceramics and thin films

Bolten, D.
2003

Journal of applied physics, 93 (2003) S. 1735 - 1742

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6

Journal Article

An interfacial defect layer observed at (Ba,Sr)TiO3/Pt interface

Jin, H. Z.
2003

Thin solid films, 429 (2003) S. 282 - 285

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7

Journal Article

Sharp ferroelectric phase transition in strained epitaxial SRO-BST-SRO capacitors

Dittmann, R.
2003

Applied physics letters, 83 (2003) S. 5011

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8

Journal Article

Short-time piezoelectric measurements in ferroelectric thin films using a double-beam laser interferometer

Gerber, P.
2003

Review of scientific instruments, 74 (2003) S. 2613 - 2615

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9

Journal Article

Early self-assembled stages in epitaxial SrRuO3 on LaAlO3

Vasco, E.
2003

Applied physics letters, 82 (2003) S. 2497

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10

Journal Article

Coercive field of ultrathin PbZr0.52Ti0.48O3 epitaxial films

Pertsev, N. A.
2003

Applied physics letters, 83 (2003) S. 3356

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11

Journal Article

Surface treatment effects on the thickness dependence of the remanent polarization of PbZr0.52Ti0.48O3 capacitors

Rodriguez Contreras, J.
2003

Applied physics letters, 83 (2003) S. 126

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12

Journal Article

SrBi 2Ta 2O 9 ferroelectric thin film capacitors: degradation in a hydrogen ambient

Hartner, W.
2003

Applied physics / A, 77 (2003) S. 571 - 579

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13

Journal Article

Influence of asymmetric oxide electrode structures on the interface capacity and the failure mechanisms in PZT thin films

Ellerkmann, U.
2003

Integrated ferroelectrics, 52 (2003) S. 63

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