JuLib | Articles & more

1

Influence of asymmetric oxide electrode structures on the interface capacity and the failure mechanisms in PZT thin films

Ellerkmann, U.
2003

2

Journal Article

Frequency and temperature dependence of the relative permittivity in ferroelectrics: Monte-Carlo simulation study

Bolten, D.
2003

Journal of applied physics, 93 (2003) S. 2890 - 2894

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3

Conference Presentation

Influence of asymetric electrode structures including SrO and IrO on the interfacial capacitance and the failure mechanisms in PZT thin films

Ellerkmann, U.
2003

4

Journal Article

Reversible and irreversible polarization processes in ferroelectric ceramics and thin films

Bolten, D.
2003

Journal of applied physics, 93 (2003) S. 1735 - 1742

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5

Journal Article

The interface screening model as origin of imprint in PbZrx/Ti1-x/O3 thin films 1 : dopant, illumination, and bias dependence

Grossmann, M.
2002

Journal of applied physics, 92 (2002) S. 2680 -2687

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6

Journal Article

Influence of defects on the properties of a 2D ferroelectric: A Monte-Carlo simulation study

Bolten, D.
2002

Japanese journal of applied physics, 41 (2002) S. 7202 - 7210

7

Journal Article

(Pb1-xBax)TiO3 thin films prepared by liquid delivery MOCVD : influence of the process parameters on film formation and electrical properties

Ritter, S.
2002

Ferroelectrics, 268 (2002) S. 143 - 148

8

Journal Article

The interface screening model as origin of imprint in PbZrxTi1-xO3 thin films. II. Numerical simulation and verification

Grossmann, M.
2002

Journal of applied physics, 92 (2002) S. 2688 - 2696

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9

Journal Article

Grossmann, M.
2002

Applied physics letters, 80 (2002) S. 1427 - 1429

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10

Journal Article

Relaxation mechanisms in ferroelectric thin film capacitors for FeRAM application

Lohse, O.
2001

Integrated ferroelectrics, 33 (2001) S. 39 - 48

11

Contribution to a book
Contribution to a conference proceedings

Transient behavior of the polarization in ferroelectric thin film capacitors

Lohse, O.
2001

12

Journal Article

Influence of the measurement parameters on the reliability of ferroelectric thin films

Grossmann, M.
2001

Integrated ferroelectrics, 32 (2001) S. 1 - 9

13

Journal Article

Domain switching, rotation processes and dielectric response of polycrystalline Pb(Zr xTi 1-x)O3 thin films

Topolov, V. Y.
2001

Journal of physics / D, 34 (2001) S. 711 - 716

14

Journal Article

Relaxation mechanism of ferroelectric switching in (Pb/Zr,Ti)O3 thin films

Lohse, O.
2001

Journal of applied physics, 89 (2001) S. 2332 - 2336

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15

Journal Article

Irreversible polarization in donor doped Pb(Zr,Ti)O3

Bolten, D.
2001

Integrated ferroelectrics, 32 (2001) S. 93 - 99

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